Browse Prior Art Database

Connector Probe

IP.com Disclosure Number: IPCOM000080739D
Original Publication Date: 1974-Feb-01
Included in the Prior Art Database: 2005-Feb-27
Document File: 2 page(s) / 37K

Publishing Venue

IBM

Related People

Bocinski, TE: AUTHOR [+2]

Abstract

The tight assembly of present day electronic packaging arrangements leaves little room for probing pins attached with test equipment. This is a mini connector probe design to facilitate the electrical connections with terminal devices, which are soldered to printed-circuit boards and cards.

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Connector Probe

The tight assembly of present day electronic packaging arrangements leaves little room for probing pins attached with test equipment. This is a mini connector probe design to facilitate the electrical connections with terminal devices, which are soldered to printed-circuit boards and cards.

The mini connector probe comprises a housing 10 into which fits a slidable metal contacting tip 11, having a finger actuating element 12 attached thereto. The housing 10 has a corresponding pair of wide based U-shaped slots 13 in its sides. The contacting tip 11 includes a detenting pin 14 attached thereto and a spring 15 for biasing the tail portion of the slidable tip 11 in an upward direction, so as to detent the slidable tip 11 in its actuated or retracted positions. Extending from the rear portion of the actuating element 12, is a wire 16 that is electrically connected with contacting tip 11 and with a socket 17. The socket 17 is adapted for connection with electrical test equipment.

This device provides a self-contained, Self-storing probing tip particularly designed to enable a serviceman to plug into terminal devices attached to printed-circuit boards and cards, and to make probing operations by simple insertions of the tip element into the desired pin sockets of the terminal devices. The contacting tip can be latched in its actuated or retracted positions.

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