Browse Prior Art Database

Logic Cards Test Method

IP.com Disclosure Number: IPCOM000080976D
Original Publication Date: 1974-Mar-01
Included in the Prior Art Database: 2005-Feb-27
Document File: 2 page(s) / 31K

Publishing Venue

IBM

Related People

Miche, J: AUTHOR

Abstract

Testing of electronic devices is necessary to insure that the devices reach a determined level of quality. Testing of logic cards is generally accomplished by providing on the card, in addition to the functional input and output pins, a number of output (and, if necessary, input) pins. This reduces proportionally the number of functional input and output pins.

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Logic Cards Test Method

Testing of electronic devices is necessary to insure that the devices reach a determined level of quality. Testing of logic cards is generally accomplished by providing on the card, in addition to the functional input and output pins, a number of output (and, if necessary, input) pins. This reduces proportionally the number of functional input and output pins.

Therefore, in order to increase the number of functional input and output pins, there are provided on the card: a) A digital multiplexor;

b) A light indicator; and

c) A minimal number of permanently assigned test pins for

applying a coded test addresses to the digital multiplexor,

and a single test output pin.

Test patterns are injected through the functional input pins and the test point outputs are multiplexed by the digital multiplexer, to which the coded addresses of the test point outputs are sequentially applied.

The multiplexed test outputs are fed to a test output pin and to a light indicator, e.g., a light-emitting diode.

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