Browse Prior Art Database

Vacuum Holding and Testing Fixture

IP.com Disclosure Number: IPCOM000080991D
Original Publication Date: 1974-Mar-01
Included in the Prior Art Database: 2005-Feb-27
Document File: 2 page(s) / 41K

Publishing Venue

IBM

Related People

Bauer, HG: AUTHOR [+2]

Abstract

By setting on a vacuum source, a circuit substrate to be tested is initially arrested and immediately afterwards a contact pin retainer block is lifted into its active position.

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Vacuum Holding and Testing Fixture

By setting on a vacuum source, a circuit substrate to be tested is initially arrested and immediately afterwards a contact pin retainer block is lifted into its active position.

Circuit substrate 1 is located between positioning pieces 2 on a carrier plate 3, which is permanently supported on guide columns 4.

By bushes 5, a contact pin retainer block 6 is arranged to be vertically shiftable on guide columns 4. Between carrier plate 3 and contact pin retainer block 6 pressure springs 7 are active, and a sealed chamber 9 is formed by packing washers 8. Similarly, the upper surface of carrier plate 3 comprises packing washers 10 resting against the lower side of circuit substrate 1. Contact pins 11 in contact pin retainer block 6 protrude through corresponding bores 12 in carrier plate 3.

By setting on the vacuum which passes through bores 12, circuit substrate 1 is initially arrested. As a result of the counteracting force of pressure springs 7, contact pin retainer block 6 is lifted up as the vacuum develops in chamber 9, and contact is established between contact pins 11 and the contact points on circuit substrate 1. The magnitude of the vacuum power acting onto circuit substrate 1 before contact pin retainer block 6 is lifted up, can be modified by the selection of springs 7.

After withdrawal of the vacuum, contact pin retainer block 6 drops back into its original position, and circuit substrate 1 can be removed.

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