Browse Prior Art Database

Module Test and Handling Apparatus

IP.com Disclosure Number: IPCOM000081180D
Original Publication Date: 1974-Apr-01
Included in the Prior Art Database: 2005-Feb-27
Document File: 2 page(s) / 71K

Publishing Venue

IBM

Related People

House, LD: AUTHOR

Abstract

Large-scale integrated (LSI) devices incorporated into modules may be automatically tested and transported among manufacturing stations, in a manner to eliminate electrostatic discharge effects; retain the modules in the same registration or orientation, and protect the modules against impact and force during transportation. The test and transport apparatus eliminates repetitive handling of the modules by operators.

This text was extracted from a PDF file.
At least one non-text object (such as an image or picture) has been suppressed.
This is the abbreviated version, containing approximately 54% of the total text.

Page 1 of 2

Module Test and Handling Apparatus

Large-scale integrated (LSI) devices incorporated into modules may be automatically tested and transported among manufacturing stations, in a manner to eliminate electrostatic discharge effects; retain the modules in the same registration or orientation, and protect the modules against impact and force during transportation. The test and transport apparatus eliminates repetitive handling of the modules by operators.

Modules 1, typically conventional C or P-DIP packages are loaded into a tray pack 3. A tray pack has three grooves to accommodate three columns of modules 1. The tray pack 3 is also of conductive material which eliminates the problem of electrostatic discharge to LSI devices fabricated in field-effect transistor (FET) technology. Modules are transported in the same registration or orientation from one manufacturing station to another. The tray packs eliminate repetitive handling of the modules by operators.

A test apparatus 5 unloads the modules 1 from the tray pack 3; tests the modules and reloads the modules into another tray pack 15. To load a tray pack 3 into the test apparatus, a cassette release button 17 is pushed. The cassette 4 pivots about a hinge 6. The tray pack is inserted within the cassette 4 and a negator is automatically urged away from a "home" position. A module ejection mechanism 10 is loaded when the tray pack 3 is in place in the cassette 4. The cassette is returned to the close position and aut...