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Browse Prior Art Database

Apparatus for High Temperature Microindentation Studies

IP.com Disclosure Number: IPCOM000081638D
Original Publication Date: 1974-Jul-01
Included in the Prior Art Database: 2005-Feb-28
Document File: 2 page(s) / 71K

Publishing Venue

IBM

Related People

Hu, SM: AUTHOR

Abstract

This apparatus facilitates the study of dislocation movement in crystalline material, particularly in certain materials, such as covalent silicon, where plastic deformation will take place only above certain temperatures. In general, the study of the fine details of dislocation movement requires very reproducible indentations with negligible impact.

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Apparatus for High Temperature Microindentation Studies

This apparatus facilitates the study of dislocation movement in crystalline material, particularly in certain materials, such as covalent silicon, where plastic deformation will take place only above certain temperatures. In general, the study of the fine details of dislocation movement requires very reproducible indentations with negligible impact.

The apparatus has a small double-jacketed stainless steel furnace 1, an indentation rod 2 entering the furnace through an aperture in the top to which is affixed a diamond indentator on the end thereof, weights 3 directly over rod 2, a balance beam 4 pivoted on a miniature ball bearing 5, a counterweight 6 supported on beam 4, and a counterweight 7 for fine adjustment.

Also included is a beam arrestor 8 provided to control the movement of beam 4, an arrestor actuating arm and handle knob 9, an air dashpot 10 associated with the actuating arm 9, an air leak adjustment needle valve 11 for controlling the air to dashpot 10, adjustment means for adjusting the support to the furnace 1 in the X, Y and Z directions indicated by 12, 13 and 14, and a base plate 15 for supporting the foregoing elements. Temperature control 16 is used in conjunction with the microindentator.

The furnace 1 has an opening in the top, of approximately 5/8 of an inch in diameter. This allows the indentor to move in an X-Y manner across a given area of sample 18 shown in Fig. 2. The entire setup can be placed in an inert gas filled...