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Mulipoint Test Probe for Printed Cards

IP.com Disclosure Number: IPCOM000081654D
Original Publication Date: 1974-Jul-01
Included in the Prior Art Database: 2005-Feb-28
Document File: 2 page(s) / 92K

Publishing Venue

IBM

Related People

Renz, U: AUTHOR

Abstract

This apparatus is used for testing printed line connections 1 between plated through holes 2 in circuit cards or hoards in test samples 3 and the pads disposed on at least one side edge 4. Contact pins 5 are selected and controlled by a mask 6 taking the form of a rough circuit card having the same hole pattern as test sample 3. The contact pin length is reduced by the length of the pads. One card out of the production series of test samples 3 is used as a mask 6.

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Mulipoint Test Probe for Printed Cards

This apparatus is used for testing printed line connections 1 between plated through holes 2 in circuit cards or hoards in test samples 3 and the pads disposed on at least one side edge 4. Contact pins 5 are selected and controlled by a mask 6 taking the form of a rough circuit card having the same hole pattern as test sample 3. The contact pin length is reduced by the length of the pads. One card out of the production series of test samples 3 is used as a mask 6.

The test sample assembly consists of a base plate 7 accommodating and holding in place test sample 3, an adapter 8, a head part 9, and a connector plate, not shown. Parts 7, 8, 9 are superimposed on each other. Adapter 8 and head part 9 each comprise, respectively, one aperture plate 10, 11 made of insulating material and holes 12, 13, which correspond to the raster dimensions of the various test samples 3.

In holes 13 of head part 9 movable resilient pressure pins 14 are inserted which, in the idle state, (Fig. 1) protrude from lower surface 15 of head part 9. Pressure pins 14 are electrically connected to lines in the connector plate, which lead to the tester.

In holes 12 of adapter 8 movable contact pins 5 are inserted, the lower surface of which is provided with a preferably conically shaped contact piece 16, whose diameter is greater than that of hole 17 in mask 6. In the idle state, contact pins 5 are raised by a pressure spring 18, thus preventing contact pi...