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Dual Buckling Beam Connectors for Test Probes

IP.com Disclosure Number: IPCOM000081745D
Original Publication Date: 1974-Jul-01
Included in the Prior Art Database: 2005-Feb-28
Document File: 2 page(s) / 58K

Publishing Venue

IBM

Related People

Bruder, SI: AUTHOR [+3]

Abstract

A connector assembly of beam lead connectors, each subject to buckling deformation at two positions, serves as a replaceable connection module. The lower lead terminations are adapted for resilient buckling engagement with a dense configuration of circuit terminals (e.g., lands on a large-scale integrated (LSI) chip). The upper leads connect to signal and power sources and sinks. The assembly is useful as either a test probe or semipermanent connection subsystem.

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Dual Buckling Beam Connectors for Test Probes

A connector assembly of beam lead connectors, each subject to buckling deformation at two positions, serves as a replaceable connection module. The lower lead terminations are adapted for resilient buckling engagement with a dense configuration of circuit terminals (e.g., lands on a large-scale integrated (LSI) chip). The upper leads connect to signal and power sources and sinks. The assembly is useful as either a test probe or semipermanent connection subsystem.

The beam leads channelled through the lower plastic guide member may be densely configured for light-force (e.g., probing) connection, with allowance for buckling to eliminate force differences. The lower guide channels are appropriately configured to allow the lower leads to deflect and buckle within predetermined limits and exert predetermined nondestructive contact forces.

The beam leads channelled through the upper guide are permitted to buckle in the space between the upper and lower guide assemblies. This permits contact loading of the upper lead extensions into respective sockets with high but uniform compressive force. The beam lead assemblies (upper and lower) are formed of appropriately resilient separate conductive sheets (e.g., beryllium copper) etched into the discrete beam lead configurations, requisite to the respective (upper, lower) connection functions and geometry.

The apparatus is especially useful where a large number of densely configure...