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Test Probes for Use in Controlled Environments

IP.com Disclosure Number: IPCOM000081857D
Original Publication Date: 1974-Aug-01
Included in the Prior Art Database: 2005-Feb-28
Document File: 2 page(s) / 111K

Publishing Venue

IBM

Related People

Bohner, JE: AUTHOR [+5]

Abstract

Disclosed are probes which may be employed in close quarters in populated substrates to obtain necessary test readings to insure proper operation of the devices employed on the substrate. Illustrated are three probes of generally the same basic design, a diagnostic probe, a scope probe and a calibration probe. Each of the probes is provided with a hermetically sealed tube or housing 3 which houses an electronic package 2 (a thin PC board populated with microminiature electronic components) so as to provide the active components for measuring, calibration, etc., as close as possible to the probe tip 6.

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Test Probes for Use in Controlled Environments

Disclosed are probes which may be employed in close quarters in populated substrates to obtain necessary test readings to insure proper operation of the devices employed on the substrate. Illustrated are three probes of generally the same basic design, a diagnostic probe, a scope probe and a calibration probe. Each of the probes is provided with a hermetically sealed tube or housing 3 which houses an electronic package 2 (a thin PC board populated with microminiature electronic components) so as to provide the active components for measuring, calibration, etc., as close as possible to the probe tip 6. The probe body 1 and housing 3 are secured and sealed by screws 10 which pass through a sealing cap 9 and connect to the base of the probe, the housing fitting into a seal 11 circumscribing the housing 3 and preventing the environment from entering into the housing of the probe. When desired, the electronic package 2 may mate with electrical contacts 4 in the probe and connect to the probe tips 6. The probes may be connected through the cap 9 to any convenient plug-in connector, for example, the connector 8 by way of cable 7, the connection to the PC board 2 or to the probe itself, for example, the scope probe 13 by direct connection or by a contactor such as the contactor 5 which is nothing more than a male-to-female connector. As shown, the scope probe includes a shielding insert or the like 12 which may be employed t...