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Test Technique for Field Replaceable Units

IP.com Disclosure Number: IPCOM000082167D
Original Publication Date: 1974-Oct-01
Included in the Prior Art Database: 2005-Feb-28
Document File: 2 page(s) / 41K

Publishing Venue

IBM

Related People

Falcoz, A: AUTHOR [+2]

Abstract

A test technique for Field Replaceable Units (FRU's) having a high degree of integration. This is a method for testing feedback and intermodule connections on a card on which such connections are normally unavailable on test points.

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Test Technique for Field Replaceable Units

A test technique for Field Replaceable Units (FRU's) having a high degree of integration. This is a method for testing feedback and intermodule connections on a card on which such connections are normally unavailable on test points.

The solution proposed here consists in opening for test all these intermodule and feedback connections, and having them available on connectors as input and output pins when a test is performed. Straps are also available to propagate test points available or for reestablishing the normal intermodule wiring. The figure shows a three-module card with normal I/O pins available on the lower part of the figure, while intermodule and feedback test points are shown on the upper part.

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