Browse Prior Art Database

Socket Connector for Berg Header Cards

IP.com Disclosure Number: IPCOM000082261D
Original Publication Date: 1974-Nov-01
Included in the Prior Art Database: 2005-Feb-28
Document File: 2 page(s) / 32K

Publishing Venue

IBM

Related People

Brain, ML: AUTHOR

Abstract

The present test socket connector device is designed for testing large-scale integration (LSI) cards which have commercial Berg headers as the main I/O edge connector.

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Socket Connector for Berg Header Cards

The present test socket connector device is designed for testing large-scale integration (LSI) cards which have commercial Berg headers as the main I/O edge connector.

The device features a main body assembly composed of four parts. As shown in Fig. 1, the parts are a back plate 1, a center plate 2, a front plate 3, and contact straps 4. The unit is designed as a double row, four-contact assembly, as shown in Fig. 2. Thus, any multiple of four blade units can accommodate the 8-12-16-20-24 and 32 position Berg connectors in use on cards.

The units are assembled on a special test head in positions corresponding to the Berg header locations on the particular part being tested. A single contact unit may be used for the Berg single right-angle header. When the tester head is lowered, the twin-pronged assembly is inserted between the rows of square pins of the Berg header and makes contact on the inside surface of each pin row. A contact force of approximately 35 grams per pin is obtained by preload and by deflecting the blades 0.007'' - 0.010'' at insertion. Excellent contact wipe is accomplished simultaneously.

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