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Process Dependent Sampling Scheme

IP.com Disclosure Number: IPCOM000082982D
Original Publication Date: 1975-Mar-01
Included in the Prior Art Database: 2005-Feb-28
Document File: 2 page(s) / 48K

Publishing Venue

IBM

Related People

Kulkarni, MV: AUTHOR [+4]

Abstract

In order that each batch or lot coming out of a process acceptable, it is of utmost importance to have an efficient sampling scheme. The program described here provides the essential sampling plan parameters for the probability of batch or lot acceptance. On the other hand, if a sampling scheme is already known, then this technique will also tell what percentage of the time each batch or lot from the process will be acceptable. Both these features are made available through a conversational APL computer program (see flow chart).

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Process Dependent Sampling Scheme

In order that each batch or lot coming out of a process acceptable, it is of utmost importance to have an efficient sampling scheme. The program described here provides the essential sampling plan parameters for the probability of batch or lot acceptance. On the other hand, if a sampling scheme is already known, then this technique will also tell what percentage of the time each batch or lot from the process will be acceptable. Both these features are made available through a conversational APL computer program (see flow chart).

The distribution of the number of defects in samples from a Beta distributed process is first found. Then a relationship is developed between the probability of lot acceptance and the process and sampling plan parameters. For specified process parameters, this relationship is explored to provide a sampling scheme for a given probability of lot acceptance.

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