Browse Prior Art Database

Test Fixture

IP.com Disclosure Number: IPCOM000083707D
Original Publication Date: 1975-Jul-01
Included in the Prior Art Database: 2005-Mar-01
Document File: 2 page(s) / 34K

Publishing Venue

IBM

Related People

Bruder, SI: AUTHOR

Abstract

Depicted in Figs. 1 and 2 is an off-line alignment test fixture 3, which is used to align populated substrate 1 flange 2 assemblies for testing.

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Test Fixture

Depicted in Figs. 1 and 2 is an off-line alignment test fixture 3, which is used to align populated substrate 1 flange 2 assemblies for testing.

The populated substrate 1 flange 2 assembly is placed and seated into the test fixture 3, as shown in the figures.

The operator aligns the populated substrate 1 flange 2 assembly within the fixture 3 by well-known optical and other techniques, and then locks the assembly into place by locking devices 4.

After proper alignment, the fixture 3 with populated substrate 1 flange 2 assembly is affixed to the tester. The populated substrate is then tested.

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