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Resistor Tracking Measuring Device

IP.com Disclosure Number: IPCOM000083908D
Original Publication Date: 1975-Aug-01
Included in the Prior Art Database: 2005-Mar-01
Document File: 2 page(s) / 21K

Publishing Venue

IBM

Related People

Nuez, JP: AUTHOR

Abstract

Presented is a method for measuring the tracking of precise resistors in a semiconductor chip (ion-implanted resistor, for example).

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Resistor Tracking Measuring Device

Presented is a method for measuring the tracking of precise resistors in a semiconductor chip (ion-implanted resistor, for example).

Four identical resistors R are wired on the chip in a Wheatstone bridge configuration according to the drawing.

Simulation with a computer bearing on a great number of chips, shows that the measured voltage Vm is Gaussian distributed with the assumption that the tracking is also a Gaussian distribution. The statistical spread of the measured voltage is proportional to the tracking. This method represents a convenient way for measuring the tracking, because the measurement is directly the error. It is an opposition method.

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