Browse Prior Art Database

Floating Bias Plate for Buckling Column Contractor

IP.com Disclosure Number: IPCOM000084050D
Original Publication Date: 1975-Sep-01
Included in the Prior Art Database: 2005-Mar-02
Document File: 2 page(s) / 23K

Publishing Venue

IBM

Related People

Dombroski, EJ: AUTHOR [+2]

Abstract

Described is a floating bias plate for buckling beam contactors, which provides a reliable method for controlling lateral deflection of buckling beam probes throughout the deflection process on high-density contactors, while controlling the direction of lateral buckling and keeping the individual probe members isolated to prevent shorting out of the members.

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Floating Bias Plate for Buckling Column Contractor

Described is a floating bias plate for buckling beam contactors, which provides a reliable method for controlling lateral deflection of buckling beam probes throughout the deflection process on high-density contactors, while controlling the direction of lateral buckling and keeping the individual probe members isolated to prevent shorting out of the members.

The buckling beam technique requires the use of a probe member which has a length many times its diameter. As such, the lateral deflection of the probe member is large in relation to its vertical deflection, usually in the order of about 5 to 1. High-density contactors incorporating many probe members and close centers, requires a reliable method for controlling the lateral deflection to insure that they do not randomly buckle, resulting in possible probe shorting and actual force variance due to adjacent interference.

Shown is a buckling beam probe in which the attendant problems associated with the prior art techniques has been eliminated. In the figure, each probe 10 is a 5 mil gold plated tungsten wire, whose loading against the part to be tested is achieved by allowing a free length between plates or guides 14 and 15 to buckle as a column. The probe 10 is fixed at one end 13 and passes through the top guide 14 and the bottom guide 15.

If allowed to buckle in random directions, adjacent probe wires 10 interfere with one another. To avoid this, a spring lo...