Browse Prior Art Database

Probe Beam Insulator

IP.com Disclosure Number: IPCOM000084218D
Original Publication Date: 1975-Oct-01
Included in the Prior Art Database: 2005-Mar-02
Document File: 2 page(s) / 43K

Publishing Venue

IBM

Related People

Faure, LH: AUTHOR [+3]

Abstract

Because of the deflection of buckling beam probes which are employed for testing microminiature circuit patterns, it is necessary to insure that deflection of the probes occur in the same line of action, and that at least the probes of one row are insulated from probes of another row.

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Probe Beam Insulator

Because of the deflection of buckling beam probes which are employed for testing microminiature circuit patterns, it is necessary to insure that deflection of the probes occur in the same line of action, and that at least the probes of one row are insulated from probes of another row.

The drawing illustrates a typical buckling beam probe assembly 10 with an insulator 11 in place. For simplicity, only a few beams 12 are shown. The actual probe may contain up to 260 beams, of, for example, 0.004'' diameter on 0.010'' centers and arranged in rows.

In order to insure deflection of the beams 12 in a predetermined line of action, while simultaneously insulating one beam from the other, the separator 11 is preferably composed of an etched glass. In the present instance, the glass plate insulator 11 is 0.015'' thick with 0.004'' to 0.005'' wide slots 13 on 0.008'' to
0.010'' centers.

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