Browse Prior Art Database

Test Equipment Fixture

IP.com Disclosure Number: IPCOM000084244D
Original Publication Date: 1975-Oct-01
Included in the Prior Art Database: 2005-Mar-02
Document File: 2 page(s) / 66K

Publishing Venue

IBM

Related People

Gustafson, RM: AUTHOR

Abstract

Depicted in the drawing is apparatus for holding and maintaining a semiconductor module at a controlled temperature during testing thereof. Chuck 1 on shaft 2 is counterbalanced by a spring 3. The shaft 2 is retained in the chuck 1 by set screws 4. The spring 3 is supported by the inner housing 5 and retaining washer 6 which is held in place by screws 7.

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Test Equipment Fixture

Depicted in the drawing is apparatus for holding and maintaining a semiconductor module at a controlled temperature during testing thereof. Chuck 1 on shaft 2 is counterbalanced by a spring 3.

The shaft 2 is retained in the chuck 1 by set screws 4. The spring 3 is supported by the inner housing 5 and retaining washer 6 which is held in place by screws 7.

The module socket 8 is mounted on a printed-circuit card 9. A base ring 10 surrounds the module socket 8 and is secured to the printed-circuit card 9.

The inner housing 5 has an outside diameter that mates with the base ring 10 and is also keyed to the base ring key. Shaft 2 is located with respect to inner housing 5 by pin 12. A microswitch actuator 13 is secured by the base ring 10. The microswitch 14 is mounted inside of the inner housing 5 and is set to indicate when the unit is in place.

A locking housing 15 fits over the inner housing 5 and is held in place by shoulder screws 16. The locking housing 15 has L-shaped locking tabs 15A which engage with the base ring 10.

The chuck 1 is liquid cooled. The tubing 1A and 1B feeds the cooling medium. Cable 1C carries the control circuit leads.

The test equipment fixture operates as follows: The locking housing 15 is turned counterclockwise and in this position everything above the mounting ring 10 and module socket 8 is removed as a unit.

Next, the module 8A to be tested is inserted in the module socket 8. The chuck 1 and housing 5 is lifted...