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Manufacturing Test for Data Processing System

IP.com Disclosure Number: IPCOM000084297D
Original Publication Date: 1975-Oct-01
Included in the Prior Art Database: 2005-Mar-02
Document File: 2 page(s) / 27K

Publishing Venue

IBM

Related People

Becker, RC: AUTHOR [+2]

Abstract

The drawing shows an instruction processor, a store, and two input/output (I/O) processors that are interconnected with other components of a data processing system by a buss. The I/O processors are connected with I/O devices.

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Manufacturing Test for Data Processing System

The drawing shows an instruction processor, a store, and two input/output (I/O) processors that are interconnected with other components of a data processing system by a buss. The I/O processors are connected with I/O devices.

In the manufacture of a data processing system, these components are assembled for tests of the buss and other components. Although operation of the I/O devices is necessary for these tests, the I/O devices are frequently not actually available for the tests, as the dashed lines in the drawing represent. In the system of the drawing, the operation of these devices is simulated by the I/O processors.

For testing the buss or other components, the store is loaded with test programs that cause the I/O processor to transmit sequences of I/O instructions (test cases) to the I/O processors. These I/O instructions require the actual or simulated operation of I/O devices. A test case may be directed to a single I/O processor, or test cases can be supplied to several I/O processors, so that the components can be tested for the capability of the system to respond to contention among the I/O processors for access to the buss.

The control store of I/O processors is loaded with a program to simulate the operation of an I/O device. An area of the control store can also be used by the I/O processor for temporarily storing data that is generated during the test. For example, an I/O processor might respond to a c...