Browse Prior Art Database

Switching Probe

IP.com Disclosure Number: IPCOM000084799D
Original Publication Date: 1976-Jan-01
Included in the Prior Art Database: 2005-Mar-02
Document File: 2 page(s) / 44K

Publishing Venue

IBM

Related People

Beck, RW: AUTHOR

Abstract

A circuit probe as described herein combines in one structure a probe for making contact with selected points on a printed-circuit card, for example, and a switch structure for electrically switching a probe between circuits.

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Switching Probe

A circuit probe as described herein combines in one structure a probe for making contact with selected points on a printed-circuit card, for example, and a switch structure for electrically switching a probe between circuits.

A first embodiment as shown in Figs. 1 and 2 is arranged to switch the probe from a first circuit, such as a common ground, to a second individual circuit completed through a probe actuator.

The probe comprises a metallic sleeve 3 encasing a probe plunger 5 having thereon a pointed end 7, which makes contact with a metallic hole 9 in a printed-circuit card 11. Hole 9 is connected to a network, not shown, on one or the other or both sides of card 11.

The upper end of plunger 5 is enlarged as shown and the lower end of sleeve 3 is swaged so that the plunger 5, while free to move in the sleeve 3, cannot escape therefrom.

Plunger 5 is biased to extend outwardly from sleeve 3 by a compression spring 13. Sleeve 3 is provided with a collar 15 which abuts a conductive mounting plate 17. A solid metallic cylinder 19, slideably mounted in an insulating bushing 21, is attached to or forms an integral part of the assembly as shown and has an enlarged head 23.

During test operations, the common mounting plate 17 with one or more probes thereon is moved relative to the printed-circuit card 11 under test, so that the pointed ends 7 of one or more of the test probes engage the conductive holes 9 in the printed-circuit card, the spring 13 providing the necessary contact pressure. Electrical connecti...