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Path Test System for Digital Switching Network

IP.com Disclosure Number: IPCOM000084835D
Original Publication Date: 1976-Jan-01
Included in the Prior Art Database: 2005-Mar-02
Document File: 3 page(s) / 45K

Publishing Venue

IBM

Related People

Benichou, C: AUTHOR

Abstract

In a digital switching network such as SN, any connection between two terminals such as A and B is made through two digital channels, say an input channel and an output channel.

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Path Test System for Digital Switching Network

In a digital switching network such as SN, any connection between two terminals such as A and B is made through two digital channels, say an input channel and an output channel.

Both channels comprise the same number of slots, each slot being assigned to a communication. When a slot is idle, the terminal connected to the network will transfer onto the output channel the information contained in the input channel.

A test unit TU is connected to network SN through input and output channels IT and OT similar to those referred to above. This unit TU is able to generate digital patterns similar to those transmitted by terminals A or B, to transmit them through the network and to receive them from the network. It is also able to compare the pattern transmitted with the pattern received. For instance, in an 8- bit system, 256 different test patterns can be used simultaneously.

A connection between terminals A and B is made through the path represented in Fig. 1 by firm lines, i.e.: - Transmitter TA of terminal A is connected to receiver RB of terminal B through network path IA-OB; and - Transmitter TB of terminal B is connected to receiver RA of terminal A through network path IB-OA.

The test of both network paths IA-OB and IB-OA is made in two steps as follows:

1st step: The connections represented by dotted lines in Fig. 1 are established, so that a test pattern transmitted by test unit TU flows through the the following path: IT-OA, terminal A, IA-OB, terminal B, IB-OT...