Browse Prior Art Database

Shorting Probe

IP.com Disclosure Number: IPCOM000085181D
Original Publication Date: 1976-Mar-01
Included in the Prior Art Database: 2005-Mar-02
Document File: 2 page(s) / 48K

Publishing Venue

IBM

Related People

Tyler, DA: AUTHOR

Abstract

The present device can provide a variable pressure shorting probe, which may be used to accomplish opens testing on metallized ceramic substrates.

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Shorting Probe

The present device can provide a variable pressure shorting probe, which may be used to accomplish opens testing on metallized ceramic substrates.

The probe consists of a rubber doughnut wrapped with wire. The wires are held in place on the outside of the doughnut by rubber-base cement.

The rubber doughnut can be changed in ID and OD to facilitate changes in product contact area and allow contact with all uneven surface areas repeatedly with maximum efficiency. The rubber doughnut material can also be changed for compatibility requirements. In addition, the wire size and material can be changed to increase durability and decrease contact resistance and contamination problems.

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