Browse Prior Art Database

Head Gap Width Determination

IP.com Disclosure Number: IPCOM000085417D
Original Publication Date: 1976-Apr-01
Included in the Prior Art Database: 2005-Mar-02
Document File: 2 page(s) / 38K

Publishing Venue

IBM

Related People

Parker, JE: AUTHOR

Abstract

The measurement of a magnetic film or ferrite head gap is accomplished by measuring the capacitance between its pole pieces or shields.

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Head Gap Width Determination

The measurement of a magnetic film or ferrite head gap is accomplished by measuring the capacitance between its pole pieces or shields.

A head element deposited on one pole piece or shield includes conductive portions, one of which portions extends to a similarly deposited conductive land. A mating conductive land is deposited on the opposite pole piece or shield. Alternatively, one or more of the pole pieces or shields may be entirely coated with a conductive material. The two structures are assembled using conventional spacing and bonding methods.

The assembled head is connected to a capacitance bridge or meter via wire leads to the two conductive lands or surfaces. The gap width (t) in inches will then equal: t= KK'A/C, where K is the dielectric constant of the spacing material, A is the area of the lands or surfaces in square inches, C is the capacitance in picofarads, and K' is 0.225.

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