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AC DC Multicontact Test Probe Structure and Fabrication Technique

IP.com Disclosure Number: IPCOM000085449D
Original Publication Date: 1976-Apr-01
Included in the Prior Art Database: 2005-Mar-02
Document File: 2 page(s) / 39K

Publishing Venue

IBM

Related People

Markewycz, Z: AUTHOR [+2]

Abstract

Referring to Fig. 1, the fabrication of a probe structure of the type depicted in Fig. 2 will be described. Mold top plate 6 is secured by any suitable means, not shown, to support structure 8 to which multiapertured template 9 is also secured. Mold side plates 11 and 12, utilizing alignment pins 14, are secured in proper position by threaded members 13 and clamping nuts 15. The potting template 10 is now suitably affixed to the mold structure.

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AC DC Multicontact Test Probe Structure and Fabrication Technique

Referring to Fig. 1, the fabrication of a probe structure of the type depicted in Fig. 2 will be described. Mold top plate 6 is secured by any suitable means, not shown, to support structure 8 to which multiapertured template 9 is also secured. Mold side plates 11 and 12, utilizing alignment pins 14, are secured in proper position by threaded members 13 and clamping nuts 15. The potting template 10 is now suitably affixed to the mold structure.

Top plate 6 has a sizeable number of apertures 3, only one of which is shown in cross section in Fig. 1. Each aperture 3 is adapted to receive a channel forming assembly 2 and potting wire 1. The potting wires 1 are each fed through and maintained in proper spaced relationship, one to another, by templates 9 and
10.

After the mold and foregoing structure has been assembled, the mold is filled with epoxy. Upon the curing of the epoxy the potting wires 1 and channel forming assemblies 2 are removed. The mold structure is disassembled leaving the probe body 30 as depicted in Fig. 2. Pogo type probes 17 and 18, as generally represented in Fig. 3, are inserted in each of the channels formed in the molded probe body 30. The exposed lower ends of the probes are then planarized.

For DC probing, TEFLON* coated wire 16 may be connected to pogo probe member 17. For AC probing coaxial cables 21 (50 ohm, 90 ohm or the like) are connected to members 17 with suitable commo...