Browse Prior Art Database

Test Migration Method

IP.com Disclosure Number: IPCOM000085893D
Original Publication Date: 1976-Jun-01
Included in the Prior Art Database: 2005-Mar-03
Document File: 3 page(s) / 33K

Publishing Venue

IBM

Related People

Tatak, VH: AUTHOR

Abstract

In this method, AC type functional patterns associated with a failing device are captured and stored. Also in storage is a set of patterns associated with a known good device. A comparison can then be made of failing pattern with respect to good patterns and manual analysis done. In an alternative embodiment, the patterns may be restructured and used for further analysis at a lower level of assembly to determine the exact nature of the problem.

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Test Migration Method

In this method, AC type functional patterns associated with a failing device are captured and stored. Also in storage is a set of patterns associated with a known good device. A comparison can then be made of failing pattern with respect to good patterns and manual analysis done. In an alternative embodiment, the patterns may be restructured and used for further analysis at a lower level of assembly to determine the exact nature of the problem.

A test system for performing the test technique is shown graphically in the figure. The final tester 10 attaches to the system to enable the application of diagnostics to test the functional behavior of the system. The final tester 10 identifies to the computer the diagnostic which failed.

The test bed 11 is a physically accessible set of known good field replaceable units (FRU's) that form the system logic. The test bed 11 could be an actual system with its logic FRU's more accessible to the test operator (for convenience only). This test bed is used to test a suspected failing FRU with all other FRU's known good.

A digital storage scope (DSS) 12 is used in conjunction with a multiplexer 13 to capture and store patterns from all "FRU under test" input and output connections. The operator attaches the multiplexer plug to the FRU under test to connect the input channels 14 through the multiplexer 13 to the DSS channels
15. The multiplexer 13 is suggested to solve the connection problem and by looking at all inputs and storing, no prior analysis is necessary to determine which inputs to observe' This assumes multiple passes to capture all patterns at all connection points on the FRU. If intermittent failures occur, analysis must be made to select specific points, which will be dictated by the number of channels associated with the DSS 12. The scope triggering is effected by the control computer 16.

In the alternative, a high-speed buffer could be substituted for the DSS 12 and multiplexer 13. The configuration of the memory would be a width equivalent to the number of input...