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Operational Amplifier Time Measurement Test Circuit

IP.com Disclosure Number: IPCOM000086028D
Original Publication Date: 1976-Jul-01
Included in the Prior Art Database: 2005-Mar-03
Document File: 2 page(s) / 44K

Publishing Venue

IBM

Related People

Fisher, HD: AUTHOR [+2]

Abstract

This test circuit provides the capability to measure rise time, slew rate and overshoot on general purpose integrated circuit (IC) operational amplifiers (OP AMPS) with a linear test system. The linear test system must be capable of measuring both transient and DC parameters.

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Operational Amplifier Time Measurement Test Circuit

This test circuit provides the capability to measure rise time, slew rate and overshoot on general purpose integrated circuit (IC) operational amplifiers (OP AMPS) with a linear test system. The linear test system must be capable of measuring both transient and DC parameters.

The test circuit is used to measure rise time (TR), overshoot (Vos) and slew rate (SR) on a general purpose operational amplifier. The main requirements for the test circuit, which is used in conjunction with the linear test system, is as follows: 1. TR (rise time part of transient response) is the output rise time of an operational amplifier, connected as a voltage follower, when the input is a 20 mV step function. 2. Vos (overshoot part of transient response) is the output overshoot of an OP AMP connected as a voltage follower, when the input is a 20 mV step function. 3. SR (slew rate) is the voltage follower large signal pulse response.

The input pulse to the device under test (DUT) is supplied from a driver circuit 1 which swings from +Vref to -Vref or -Vref to +Vref. The timing part of the signal is generated by block 2. The input pulse amplitude is typically 20 mV for the TR and Vos and 5 volts to 20 volts for SR.

For SR testing the output of the DUT is buffered by the high-performance voltage follower A1 and fed via a coax cable to the time measuring section of the linear system. The system will measure the time between two different pre...