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Semiconductor Electrical Parametric Testing Switch Boxes

IP.com Disclosure Number: IPCOM000086029D
Original Publication Date: 1976-Jul-01
Included in the Prior Art Database: 2005-Mar-03
Document File: 2 page(s) / 68K

Publishing Venue

IBM

Related People

Carlock, FR: AUTHOR

Abstract

Fig. 1 illustrates the main components required for an in-process electrical test probe station. The problem now becomes one of interconnecting the test equipment and the probes. In an engineering environment, a technician can connect the proper probe leads to the necessary test equipment to test a single parameter and reconnect for succeeding tests as per examples 1 and 2.

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Semiconductor Electrical Parametric Testing Switch Boxes

Fig. 1 illustrates the main components required for an in-process electrical test probe station. The problem now becomes one of interconnecting the test equipment and the probes. In an engineering environment, a technician can connect the proper probe leads to the necessary test equipment to test a single parameter and reconnect for succeeding tests as per examples 1 and 2.

Time consumption, lead breakage and increased possibility of error are some of the problems with this approach. In a manufacturing mode, with operators, the safety aspects and the high degree of training required make this approach even more impractical.

Fig. 2 illustrates the approach taken where an in-process test probe station is dedicated to semiconductor device (transistors, Schottky diodes, etc.) testing. The features incorporated to make this scheme applicable to a manufacturing environment are the following: 1. A quick-connect capability for fast changing of probe rings required by different product kerf structures and the various probe materials required at different stages of the device assembly. 2. A parameter selection switch box attached to the curve tracer that accomplishes the switching of the curve tracer outputs to the proper terminals for specific test parameters, and a safety switch to disconnect dangerous voltages from the probe ring when not in an actual test mode. 3. A device station switch box that allows the three...