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Browse Prior Art Database

Multiple Contactor Indexing Mechanism

IP.com Disclosure Number: IPCOM000086093D
Original Publication Date: 1976-Jul-01
Included in the Prior Art Database: 2005-Mar-03
Document File: 2 page(s) / 70K

Publishing Venue

IBM

Related People

Perlman, AL: AUTHOR [+3]

Abstract

A test arrangement is provided for testing components, such as chips and wafers having a multiple function or footprint. The device consists of pin electronics 11 which interfaces between the electronic tester and the contactor system 10. The contactor system 10 provides the interface between the pin electronics 11 and the product 13 to be tested.

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Multiple Contactor Indexing Mechanism

A test arrangement is provided for testing components, such as chips and wafers having a multiple function or footprint. The device consists of pin electronics 11 which interfaces between the electronic tester and the contactor system 10. The contactor system 10 provides the interface between the pin electronics 11 and the product 13 to be tested.

The product 13 is the electronic component to be tested, such as a module, wafer, chip, substrate, etc. The indexing mechanism 14, shown in Fig. 2, adjusts the contactor system 10 to precisely position one of the contactor assemblies 12 at the test position.

In operation, the pin electronics 11 is electrically connected to the selected contactor assembly 12 via a quick disconnect mechanism. During test, the product 13 is brought into contact with the selected contactor assembly 12. The indexing is performed by disengaging the product 13 from the contactor assembly 12 and disengaging the pin electronics 11 from the contactor assembly
12. The indexing mechanism 14 is automatically indexed to place the appropriate contactor assembly 12 in the test position. The pin electronics 11 and the products 13 to be tested reengage the newly selected contactor assembly 12 to permit subsequent operations.

The test arrangement shown in Fig. 1 is a probe indexing mechanism having four contactor assemblies 12 mounted in a rotating plate. One contactor assembly 12, the indexing mechanism 14, and the r...