Browse Prior Art Database

Magnetic Particle Shorting Probe

IP.com Disclosure Number: IPCOM000086460D
Original Publication Date: 1976-Sep-01
Included in the Prior Art Database: 2005-Mar-03
Document File: 2 page(s) / 38K

Publishing Venue

IBM

Related People

Faure, LH: AUTHOR

Abstract

In this probe assembly, electrical contact is made between a plurality of pads 6 on a substrate and a large number of conductive metal particles 1 in a conductive chamber. The shorting probe has a large number of tiny nickel spheres or particles 1, which are held in a chamber or cavity 2 by a magnetic force created by energizing a coil 3 around the cylindrical portion of a magnetic metal housing 4. The cavity 2 in housing 4 is surrounded by a rubber seal 5.

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Magnetic Particle Shorting Probe

In this probe assembly, electrical contact is made between a plurality of pads 6 on a substrate and a large number of conductive metal particles 1 in a conductive chamber. The shorting probe has a large number of tiny nickel spheres or particles 1, which are held in a chamber or cavity 2 by a magnetic force created by energizing a coil 3 around the cylindrical portion of a magnetic metal housing 4. The cavity 2 in housing 4 is surrounded by a rubber seal 5.

In operation, the magnetic particle shorting probe is lowered against the substrate so that the particle filled cavity is directly over and covers the substrate pads 6 which are to be shorted. The coil 3 is then de-energized, releasing the magnetic particles 1, thus permitting these particles to contact the pads 6.

Electrical connection is then made from pads 6 through the particles 1 through the cavity walls and housing 4, and through a conductor 7 which is attached to the housing 4. The conductor 7 is terminated at the test equipment. After testing, the coil 3 is re-energized to retract the particles 1 and the probe is then lifted.

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