Browse Prior Art Database

Contact Probe Assembly with a Retractable Shorting Center

IP.com Disclosure Number: IPCOM000086461D
Original Publication Date: 1976-Sep-01
Included in the Prior Art Database: 2005-Mar-03
Document File: 2 page(s) / 45K

Publishing Venue

IBM

Related People

Faure, LH: AUTHOR

Abstract

A probe with a retractable shorting center is needed in certain applications, as for example in testing for shorts between device pads and error correction pads located outside the periphery of the device pads. In this type test, both the shorting center and the exterior buckling beam contacts must be in contact with the substrate pads. In other tests, only the outside error correction pads are contacted.

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Contact Probe Assembly with a Retractable Shorting Center

A probe with a retractable shorting center is needed in certain applications, as for example in testing for shorts between device pads and error correction pads located outside the periphery of the device pads. In this type test, both the shorting center and the exterior buckling beam contacts must be in contact with the substrate pads. In other tests, only the outside error correction pads are contacted.

This probe assembly has a shorting center probe 1 which is housed within a buckling beam probe 2 and is free to slide within the center post 3 of the buckling beam probe. The probe assembly 2 has a special center post design 3, illustrated in Fig. 2, which has a vacuum and air opening 4, screw threads 5 for mounting, a square locator 6, a bottom guide locator 7 and probe insulator slots
8. The probe details which are assembled directly to the center post 3 include a top guide 9, the offset guide 10, the bottom guide 11 and probe insulators 12. The buckling beams 13 are assembled in and are free to move in guide holes 14.

The buckling beam probe assembly 2 containing the shorting center probe 1 is assembled to the combination space transformer and probe mounting plate 15, by nuts 16 and washer 17. The spherical ends of the buckling beams 13 contact the ends of magnet wires 18. The spherical ends of beams 13 are free to move in the area provided by spacer 19.

The mounting plate 15 contains an air and vaccum...