Browse Prior Art Database

Test System for Logic and Storage Components of Data Processing System

IP.com Disclosure Number: IPCOM000086729D
Original Publication Date: 1976-Oct-01
Included in the Prior Art Database: 2005-Mar-03
Document File: 1 page(s) / 11K

Publishing Venue

IBM

Related People

App, RH: AUTHOR [+4]

Abstract

When a component such as a data store module is produced in several different forms, a particular form is identified by a part number. For testing these components, programs are provided for conducting the tests and for analyzing the significance of a fault that is detected during the test. Programs for analyzing these faults are commonly made up individually for each part number. In this test system, these programs are made in subunits that often apply to tests for several part numbers.

This text was extracted from a PDF file.
This is the abbreviated version, containing approximately 100% of the total text.

Page 1 of 1

Test System for Logic and Storage Components of Data Processing System

When a component such as a data store module is produced in several different forms, a particular form is identified by a part number. For testing these components, programs are provided for conducting the tests and for analyzing the significance of a fault that is detected during the test. Programs for analyzing these faults are commonly made up individually for each part number. In this test system, these programs are made in subunits that often apply to tests for several part numbers.

When a fault is found during the test of a particular part number, a map is loaded into the main store of a processor and the map is searched, using the part number and information about the fault from the test program, to find programming subunits that are required for analyzing the test results. These units are loaded into the main store. The fault is analyzed, and, if appropriate, the test is continued. A separate program unit handles communications between the tester and the part number map.

1