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Test System for Logic Cards

IP.com Disclosure Number: IPCOM000087426D
Original Publication Date: 1977-Jan-01
Included in the Prior Art Database: 2005-Mar-03
Document File: 2 page(s) / 40K

Publishing Venue

IBM

Related People

Nay, AH: AUTHOR [+2]

Abstract

System 10 allows the comparison of a "known good" logic card 11 with a similar card 12 to be tested. While both cards are exercised with the same input signals 13 from a "stuck fault" tester or other source, corresponding modules are engaged with probes 14 and 15. Each probe has spring-loaded contact points to fit the module pins, and logic buffers to prevent transmission-line effects. Corresponding ones of the multiple lines 16 and 17 from the probes are compared in a conventional circuit 18. Miscompares on lines 19 are detected as errors by circuit 20, and outputted at 21. Operator display 22 may be switched at 23 to receive either the miscompares on lines 19, or the direct outputs of probe 15 on lines 17.

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Test System for Logic Cards

System 10 allows the comparison of a "known good" logic card 11 with a similar card 12 to be tested. While both cards are exercised with the same input signals 13 from a "stuck fault" tester or other source, corresponding modules are engaged with probes 14 and 15. Each probe has spring-loaded contact points to fit the module pins, and logic buffers to prevent transmission-line effects. Corresponding ones of the multiple lines 16 and 17 from the probes are compared in a conventional circuit 18. Miscompares on lines 19 are detected as errors by circuit 20, and outputted at 21. Operator display 22 may be switched at 23 to receive either the miscompares on lines 19, or the direct outputs of probe 15 on lines 17.

System 10 is especially useful in finding manufacturing defects in a production environment. If an error occurs only on an output pin of the tested module on card 12, then that module is defective. If an input fails, then the module which provides that input is tested, and so forth.

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