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Subminiature High Frequency Probe

IP.com Disclosure Number: IPCOM000087689D
Original Publication Date: 1977-Mar-01
Included in the Prior Art Database: 2005-Mar-03
Document File: 2 page(s) / 47K

Publishing Venue

IBM

Related People

Skobern, JR: AUTHOR

Abstract

The subminiature high-frequency probe is used to test transmission lines on substrates, chip carriers and chips with a minimum of attenuation and distortion.

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Subminiature High Frequency Probe

The subminiature high-frequency probe is used to test transmission lines on substrates, chip carriers and chips with a minimum of attenuation and distortion.

As illustrated in the figure, the probe is made of a solid, 50-ohm coaxial cable 11, a ground shield 13, an adjustable ground positioning device and needlepoint holder 15, a center conductor needlepoint holder 17 and the needlepoint probes 21 and 22. The solid coaxial cable provides a constant characteristic impedance and optimum shielding for high-frequency signals that are transmitted to the probe tip. In operation, the needlepoints make contact with a miniature transmission line or other components being tested.

If wear or damage occurs, the needles can be easily replaced. The adjustment screws 23 and 25, located in the center conductor holder, and the adjustable ground-positioning device permit independent positioning and adjustment of the probes.

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