Browse Prior Art Database

Fusible Link

IP.com Disclosure Number: IPCOM000087825D
Original Publication Date: 1977-Mar-01
Included in the Prior Art Database: 2005-Mar-03
Document File: 1 page(s) / 11K

Publishing Venue

IBM

Related People

Solomon, PM: AUTHOR

Abstract

A large number of devices subject to short-circuit failure may be tested in parallel by connecting each to a power bus through a fusible link. The fusible link evaporates under the current pulse when short-circuit failure occurs in the device. The separating of the fusible link permits testing to continue on the remaining devices and the heavy current pulses may be monitored for device failure statistics.

This text was extracted from a PDF file.
This is the abbreviated version, containing approximately 100% of the total text.

Page 1 of 1

Fusible Link

A large number of devices subject to short-circuit failure may be tested in parallel by connecting each to a power bus through a fusible link. The fusible link evaporates under the current pulse when short-circuit failure occurs in the device. The separating of the fusible link permits testing to continue on the remaining devices and the heavy current pulses may be monitored for device failure statistics.

1