Browse Prior Art Database

Tester Station Independent Relay Drive

IP.com Disclosure Number: IPCOM000088043D
Original Publication Date: 1977-Apr-01
Included in the Prior Art Database: 2005-Mar-04
Document File: 2 page(s) / 43K

Publishing Venue

IBM

Related People

Charneski, R: AUTHOR [+2]

Abstract

A tester language exists which controls analog test conditions and measurement functions. One instruction (Opcode 3E) in the language is used to control relay drive logic. In this way external custom-built relay-controlled test functions can be added to the basic tester capabilities. However, this instruction and its logic is limited in its control to periods when the testing station (one out of four) is selected and is otherwise reset.

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Tester Station Independent Relay Drive

A tester language exists which controls analog test conditions and measurement functions. One instruction (Opcode 3E) in the language is used to control relay drive logic. In this way external custom-built relay-controlled test functions can be added to the basic tester capabilities. However, this instruction and its logic is limited in its control to periods when the testing station (one out of four) is selected and is otherwise reset.

This technique provides logic which allows control of additional relay drivers independent of which test station is selected, and maintains these control conditions until independently reset. The additional instructions necessary to program this feature are Opcodes 3A, 3B, 3C, 3D and 3F. Opcode 3F like Opcode 3E is station selected dependent, but has independent reset. The control program and the language assembler are modified to accept these additional instructions. The simplified logic added to perform this function is shown in the drawing. The new instructions are similar in format to that of the 3E instruction, 2 hexadecimal addressing characters followed by 10 hexadecimal characters representing the binary states of up to 40 relay drive latches.

In certain classes of testing (test, stress, retest) where stress times are long, this approach provides a severalfold increase in tester thruput.

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