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Testing Method for a Digital To Analog Converter and an Analog To Digital Converter

IP.com Disclosure Number: IPCOM000088079D
Original Publication Date: 1977-Apr-01
Included in the Prior Art Database: 2005-Mar-04
Document File: 1 page(s) / 12K

Publishing Venue

IBM

Related People

Prilik, RJ: AUTHOR

Abstract

A method is disclosed for testing an N-bit digital-to-analog converter having its input connected to a source of sequential digital code words and an output connected to a high resolution analog-to-digital converter. A linear relationship between digital and analog values indicates proper performance.

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Testing Method for a Digital To Analog Converter and an Analog To Digital Converter

A method is disclosed for testing an N-bit digital-to-analog converter having its input connected to a source of sequential digital code words and an output connected to a high resolution analog-to-digital converter. A linear relationship between digital and analog values indicates proper performance. The method comprises the steps of: (a) inputting a full scale high code and storing the digitized value FSH of the resultant high analog voltage VFSH; (b) inputting a full scale low code and storing the digitized value FSL of the resultant low analog voltage VFSL; (c) calculating the voltage magnitude Delta VLSB corresponding to the least significant bit (LSB), as Delta VLSB = (VFSH + VFSL)/2 -1; (d) inputting a binary word having the value 2/M/-1 and measuring the resultant voltage V1, where 1 < M < N; (e) inputting a binary word having the value 2/M/ and measuring the resultant voltage V2; (f) comparing the magnitude of V2-V1 to the magnitude of Delta VLSB; and (g) repeating the steps (d), (e) and (f) for binary words 2/M + 1/ -1 and 2/M = 1/.

A logarithmic sampling of the output voltage of 2N-1 samples for the digital- to-analog converter is achieved.

A second method is disclosed for testing an N-bit analog-to-digital converter having its input connected to a high resolution digital-to-analog converter and an output connected to digital storage and compare circuits. The method com...