Browse Prior Art Database

Transducer Probe

IP.com Disclosure Number: IPCOM000088217D
Original Publication Date: 1977-May-01
Included in the Prior Art Database: 2005-Mar-04
Document File: 2 page(s) / 32K

Publishing Venue

IBM

Related People

Joseph, DL: AUTHOR

Abstract

Probe 1 is part of a processor-controlled precision measurement system (PMS) (not shown) for measuring the shapes of manufactured articles, such as castings, printed-circuit boards and the like.

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Transducer Probe

Probe 1 is part of a processor-controlled precision measurement system (PMS) (not shown) for measuring the shapes of manufactured articles, such as castings, printed-circuit boards and the like.

Tip 2 of probe 1 is mounted to hollow cylindrical rotatable head 3. Under appropriate control signals from the central processing unit (CPU) (not shown) associated with the PMS, tip 2 via head 3 is selectively, angularly positionable about axis A. The CPU also provides control signals for the relative positioning of the object (not shown) and tip 2 in the XY plane, as well as the movement of head 3 along the Z axis. When head 3 is lowered in the Z direction towards the object to be measured and tip 2 makes contact with the object, there results a deflection of spring 4. This causes pressure contact 5 to actuate the actuator member 6 of a pressure-sensitive electrical transducer 7. As a result, transducer 7 provides an output signal which is detected by appropriate circuitry (not shown) mounted in head 3. The output signal is indicative of the X, Y, Z positional coordinates of the object at the point of contact which are used in the measurement of the object. The output signal is used to stop the downward motion of head 3 along the Z axis and to retract the head 3.

Transducer 7 may, for example, be a piezoelectric crystal which is normally operated at its mechanical resonance when tip 2 is in a noncontacting condition with the object. When contact is estab...