Browse Prior Art Database

Post Reflow Test for Line Continuity

IP.com Disclosure Number: IPCOM000088262D
Original Publication Date: 1977-May-01
Included in the Prior Art Database: 2005-Mar-04
Document File: 2 page(s) / 46K

Publishing Venue

IBM

Related People

Anderson, LC: AUTHOR [+2]

Abstract

In the fabrication of gaseous discharge devices such as gas panel displays, conductor arrays are formed on glass plates and a layer of dielectric applied over the entire plate so that the conductors are not exposed directly to the gas. In large displays having high resolution, the conductor arrays may comprise 60-100 lines per inch, providing a high possibility that one or more opens will occur somewhere in the conductor array during fabrication of the plate assembly. When the line breakage occurs and is detected before the dielectric glass has been applied to the plate, the plate is repairable and can be repaired by conventional techniques at that point.

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Post Reflow Test for Line Continuity

In the fabrication of gaseous discharge devices such as gas panel displays, conductor arrays are formed on glass plates and a layer of dielectric applied over the entire plate so that the conductors are not exposed directly to the gas. In large displays having high resolution, the conductor arrays may comprise 60-100 lines per inch, providing a high possibility that one or more opens will occur somewhere in the conductor array during fabrication of the plate assembly. When the line breakage occurs and is detected before the dielectric glass has been applied to the plate, the plate is repairable and can be repaired by conventional techniques at that point. However, if breakage occurs during the reflow of the dielectric, it is desirable to identify the break at that time so that the defective plate can be culled out prior to sealing.

A test for detecting open conductors on the plate after dielectric reflow operates as follows: Referring to Fig. 1, a glass plate 1 has conductor lines 3-11 formed thereon, the conductor lines being overlaid with a layer of glass dielectric 15. An electroluminescent phosphor (EL) layer 17 is coated on a flexible metal substrate 19 and brought into contact with dielectric layer 15.

When an AC potential of approximately 700 volts peak-to-peak and a frequency of 220 kHz is applied across one set of conductor lines on the plate and metal substrate, for example, conductors 3-4, the EL phosphor adjacent t...