Browse Prior Art Database

Contact Bounce Tester

IP.com Disclosure Number: IPCOM000088894D
Original Publication Date: 1977-Aug-01
Included in the Prior Art Database: 2005-Mar-04
Document File: 2 page(s) / 41K

Publishing Venue

IBM

Related People

West, LE: AUTHOR

Abstract

This circuit will test for the length of time a contact stays open or closed to see if it exceeds some predetermined limit.

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Contact Bounce Tester

This circuit will test for the length of time a contact stays open or closed to see if it exceeds some predetermined limit.

The opening of contact 10 will cause AND gate 12 to set a latch, made up of AND gates 14 and 16, if the pulse occurs while the output of single-shot 18 is up. The output of single-shot 18 is determined by the length of the pulse of single- shot 20. The length of the pulse produced by single-shot 20 is set by the voltage VR, which can be set to a desired level.

Thus, it can be seen that if the contact is open for a period shorter than the duration of the output of single-shot 20, such as pulse 22, there will be no bounce error indication at the output of the latch. However, if the contact stays open longer than the duration of the output of single-shot 20, such as pulse 24, there will be an output signal from the latch, indicating a bounce error.

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