Browse Prior Art Database

Test apparatus for Data Processing System

IP.com Disclosure Number: IPCOM000089293D
Original Publication Date: 1977-Oct-01
Included in the Prior Art Database: 2005-Mar-04
Document File: 2 page(s) / 25K

Publishing Venue

IBM

Related People

Kazi, AM: AUTHOR

Abstract

The drawing represents apparatus for conducting electrical tests on a data processing system or component or similar test subject. The tester provides special signals and timing for a particular test subject, and the processor provides a sequence of commands to the tester for supplying test signals to the test subject and for receiving signals from the test subject. These components of the test system are conventional.

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Test apparatus for Data Processing System

The drawing represents apparatus for conducting electrical tests on a data processing system or component or similar test subject. The tester provides special signals and timing for a particular test subject, and the processor provides a sequence of commands to the tester for supplying test signals to the test subject and for receiving signals from the test subject. These components of the test system are conventional.

The tester has a relatively few input and output connections, and the test subject has a relatively large number of input and output connections. An interposer receives a subset of the input and output connections of the test subject. This connection is chosen to accommodate a wide range of tests, and is not changed during an extended sequence of tests on a particular test subject.

The connections that are established by the interposer are applied to a programmable adapter that applies a selected subset of these connections to the tester. The programmable adapter receives a control input from the processor, and the connections between the tester and the interposer can be changed from test to test under control of the processor.

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