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Functional Testing of Random Logic Using Simulation Data

IP.com Disclosure Number: IPCOM000089334D
Original Publication Date: 1977-Oct-01
Included in the Prior Art Database: 2005-Mar-04
Document File: 2 page(s) / 39K

Publishing Venue

IBM

Related People

Bollig, CJ: AUTHOR [+4]

Abstract

Functional testing and debug of prototype hardware are accomplished with the aid of a programmable tester and a special test program SOLE (Simulation On Logic Evaluator). SOLE performs four functions: (1) controls the tester to apply input test data to the prototype hardware, (2) controls the tester to sample outputs from the prototype hardware, (3) analyzes output data, and (4) generates informational displays. SOLE accomplishes these functions using data generated by a design verification simulation program, as illustrated in the drawing.

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Functional Testing of Random Logic Using Simulation Data

Functional testing and debug of prototype hardware are accomplished with the aid of a programmable tester and a special test program SOLE (Simulation On Logic Evaluator). SOLE performs four functions: (1) controls the tester to apply input test data to the prototype hardware, (2) controls the tester to sample outputs from the prototype hardware, (3) analyzes output data, and (4) generates informational displays. SOLE accomplishes these functions using data generated by a design verification simulation program, as illustrated in the drawing.

A logic designer verifies his design by generating a set of test input data to exercise a simulation model of the logic. The computer program which performs the simulation generates timing charts indicating the binary states of the inputs and outputs. The timing charts are analyzed by the designer to determine if the logic functions as specified.

After the logic design is determined to be correct, the timing chart data is processed and recorded on a test data file. The data file becomes the input to SOLE.

To test prototype hardware, SOLE first reads the test input data from the test data file. The input data is stored in the tester storage unit. SOLE next reads one timeframe of data from storage, which is transferred to a set of registers connected to the hardware input pins. SOLE next reads the tester registers which are connected to the hardware output pins, and stores...