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Coincidence Detection with Minimum Detector Count

IP.com Disclosure Number: IPCOM000089367D
Original Publication Date: 1977-Oct-01
Included in the Prior Art Database: 2005-Mar-05
Document File: 2 page(s) / 26K

Publishing Venue

IBM

Related People

Winter, EM: AUTHOR

Abstract

A coincidence, or "slit", detector has an area equal to one of the primary or column detectors to provide, in an electro-optical scanning sensor system, an enhanced signal to noise ratio.

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Coincidence Detection with Minimum Detector Count

A coincidence, or "slit", detector has an area equal to one of the primary or column detectors to provide, in an electro-optical scanning sensor system, an enhanced signal to noise ratio.

Coincidence is used in many electro-optical scanning systems as a means of removing noise from a sensor-produced data stream. In one approach (Fig. 1) the focal plane of the scanning system comprises two identical columns of detectors. A time signal caused by the scanner moving over an image would be expected to produce similar signals at the outputs of corresponding column one and column two detectors. Thus, signal and noise peaks above the sampling threshold in the output of column one detectors cause a search to be made of peaks in the corresponding column two detector output. If no peak occurs in the column two output within a small time window about a predicted time occurrence, the column one peak is declared spurious and discarded.

In the approach of Fig. 2, groups of column two detectors are replaced with a single slit detector. As the noise in a background limited system is proportional to detector area, the area of the slit detector is made equal to the area of one of the column one detectors. As the noise level in the slit is the same as in column one, the coincidence test can be accomplished in substantially the same manner as described above in connection with Fig. 1, yet at a substantial savings in the number of dete...