Browse Prior Art Database

Time Measuring System

IP.com Disclosure Number: IPCOM000089949D
Original Publication Date: 1968-Dec-01
Included in the Prior Art Database: 2005-Mar-05
Document File: 3 page(s) / 53K

Publishing Venue

IBM

Related People

Barnard, JD: AUTHOR [+2]

Abstract

In drawing A, an automatic measuring system includes computer 10, adapted to process programmed instructions. Line 12 interconnects computer 10 to adapter control unit 14. This sets up different test configurations and commands which are applied on line 16 to test measuring system TMS 18. Unit 14 contains analog and digital conversion devices such that a device under test DUT located in TMS 18 is provided with appropriate bias voltages, pin resistor loads, and signal levels from the analog section of unit 14, as well as providing control signals.

This text was extracted from a PDF file.
At least one non-text object (such as an image or picture) has been suppressed.
This is the abbreviated version, containing approximately 53% of the total text.

Page 1 of 3

Time Measuring System

In drawing A, an automatic measuring system includes computer 10, adapted to process programmed instructions. Line 12 interconnects computer 10 to adapter control unit 14. This sets up different test configurations and commands which are applied on line 16 to test measuring system TMS 18. Unit 14 contains analog and digital conversion devices such that a device under test DUT located in TMS 18 is provided with appropriate bias voltages, pin resistor loads, and signal levels from the analog section of unit 14, as well as providing control signals.

In the system detailed in drawing B, it is extremely difficult when employing oscilloscopes for measuring and scanning purposes, to discriminate and then measure a response pulse at exactly the desired time. For example, assuming it is desired to measure the rise time of an output or response pulse in the nanosecond area from a DUT, it must be insured that the signal to be measured is within the measuring range or window on the oscilloscope. It must be further insured that a sufficient portion of the rise time portion of the pulse is generated or positioned in the window area in order to obtain a meaningful measurement.

Programmable control signals via line 16 are fed to TMS 18, drawing A. TMS 18 includes pulse generator PG 20, drawing B, for applying an input test pulse signal I to tree matrix 22 such that a single input pulse is selectively switchable to any one of a plurality of input terminals 24 on device under test DUT 25. A response or output pulse 0 from DUT 25 output terminals 26 is applied to tree matrix 27 which transmits such pulse to delay and incremental advance unit 28, and then to measuring and scanning oscilloscope 29. The elements of TMS 18 are programmable and selectively controlled in response to signals applied at input lines C from unit 14.

Line C to matrix 24 selectively controls the application of an input pulse I to the desired input terminal 24 of DUT 25 in accordance with the programmable signals generated in unit 14. Similarly, the response pul...