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Browse Prior Art Database

Electrical Contact for Testing Memory Cores

IP.com Disclosure Number: IPCOM000090020D
Original Publication Date: 1969-Jan-01
Included in the Prior Art Database: 2005-Mar-05
Document File: 2 page(s) / 35K

Publishing Venue

IBM

Related People

Kamp, RL: AUTHOR [+2]

Abstract

Stationary contact members 1a and 1b of contact arrangement 1 are engaged by respective conductive sections 2a and 2b of a conventional test probe 2 during testing of miniature torroidal storage cores carried on the probe. The probe is shown at different phases of motion through the contacts in drawings A and B.

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Electrical Contact for Testing Memory Cores

Stationary contact members 1a and 1b of contact arrangement 1 are engaged by respective conductive sections 2a and 2b of a conventional test probe 2 during testing of miniature torroidal storage cores carried on the probe. The probe is shown at different phases of motion through the contacts in drawings A and B.

Each stationary contact member is a generally U-shaped element with convex portions 3 and 4 connecting central wiping portion 5 to clamped end portions 6 and 7.

The shape, dimensions, and material composition of the contact are chosen to provide effective electrical engagement between the contact and a high velocity probe while minimizing resistance to probe motion, probe wear, and contact bounce effects. Critical factors include the radii of the convex portions, the length of the central wiping portion, the inclination of the central wiping portion to the probe path, the contact material and its thickness. The contact material has properties of elastic modulus, electrical conductivity, and corrosion resistance suited to the application.

Suitable contacts are made from the material PALINEY* 7. Wire stock .007 inches thick is formed into the indicated shape with radii of .014 and .018 inches for the convex portions 3 and 4 respectively and wiping portion length .098 inches. The wiping portion is inclined at an approximate angle of 2 degrees to the probe path.

Stray magnetic field effects, tending to degrade the f...