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Browse Prior Art Database

Multicontact Probe

IP.com Disclosure Number: IPCOM000090077D
Original Publication Date: 1969-Jan-01
Included in the Prior Art Database: 2005-Mar-05
Document File: 2 page(s) / 54K

Publishing Venue

IBM

Related People

Allen, DV: AUTHOR [+3]

Abstract

This multicontact test probe has a large number of contact points, selectively presettable according to the pattern desired. Base plate 10 mounts an offset stack of guide plates 12, 14, and 16. Each guide plate mounts a layer of contact elements, the topmost ones of which are 18-1...18-6. Elements 18 are formed from stiff spring wire and are cantilever-anchored to the respective layer of the probe structure, at a position which is beyond the left-hand edge of the drawing and are not shown.

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Multicontact Probe

This multicontact test probe has a large number of contact points, selectively presettable according to the pattern desired. Base plate 10 mounts an offset stack of guide plates 12, 14, and 16. Each guide plate mounts a layer of contact elements, the topmost ones of which are 18-1...18-6. Elements 18 are formed from stiff spring wire and are cantilever-anchored to the respective layer of the probe structure, at a position which is beyond the left-hand edge of the drawing and are not shown.

The free end of each cantilevered element ends in a downturned contact wire portion 18-1C...18-6C. These portions are journaled in slots 20 in the corresponding plate 12 and apertures in plate 10. The latter is shown broken away around portions 18-1C...18-6C, but journal apertures for wires associated with lower plates 12 and 14 are shown at 22 and 24. Portions 18-1C, etc., are dimensioned so that their contact points 27 normally extend beyond the lower surface of plate 10. When the probe is placed against a circuit card or the like to be tested, the cantilevered upper parts of the wires yield resiliently to establish the desired individual contact pressure at the points.

If the probe is first applied against a template having apertures only where contact is to be made when the probe is used, the contact wires corresponding to the undesired positions, for example, portions 18-2C...18t5C, are displaced into the probe. Then, if key member 26 is placed under fle...