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Fabrication of Stable EuO Films for Application in Storage Devices

IP.com Disclosure Number: IPCOM000090233D
Original Publication Date: 1969-Mar-01
Included in the Prior Art Database: 2005-Mar-05
Document File: 1 page(s) / 11K

Publishing Venue

IBM

Related People

Ahn, KY: AUTHOR

Abstract

The evaporation of EuO films in the presence of water vapor is provided to obtain a reaction which passivates the film. Films fabricated in this manner have a typical magnetic moment of 70% that of bulk value. The partial pressure of water vapor is of the order of 10/-7/ Torr throughout the evaporation period. The optical absorption peak is at a wavelength of 6000 Angstroms with a typical absorption coefficient of 7 to 9 x 10/-4//cm. The magneto-optic rotations are lower than the best sample by 25 to 30%. This procedure can be applied during the last phase of an evaporation to allow the material close to the surface to be passivated. Some of the advantages of this method of passivation are simplicity of the film fabrication and high stability of the film when exposed to moist air.

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Fabrication of Stable EuO Films for Application in Storage Devices

The evaporation of EuO films in the presence of water vapor is provided to obtain a reaction which passivates the film. Films fabricated in this manner have a typical magnetic moment of 70% that of bulk value. The partial pressure of water vapor is of the order of 10/-7/ Torr throughout the evaporation period. The optical absorption peak is at a wavelength of 6000 Angstroms with a typical absorption coefficient of 7 to 9 x 10/-4//cm. The magneto-optic rotations are lower than the best sample by 25 to 30%. This procedure can be applied during the last phase of an evaporation to allow the material close to the surface to be passivated. Some of the advantages of this method of passivation are simplicity of the film fabrication and high stability of the film when exposed to moist air.

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