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Testing Device

IP.com Disclosure Number: IPCOM000090257D
Original Publication Date: 1969-Mar-01
Included in the Prior Art Database: 2005-Mar-05
Document File: 2 page(s) / 33K

Publishing Venue

IBM

Related People

Kehagioglou, T: AUTHOR

Abstract

This device is a zero insertion force socket for testing electronic modules. Contact blades 1 are arranged in an array which is complementary to the array of pins 2 of module 3. The latter passes unidirectionally through the blade 1 array along section 4 which is molded or machined to form comb 11. This straightens pins 2 of module 3 before it enters the test station. A module can alternatively be made to pass through the blade array along an arcuate path indicated by curved section 5. If an arcuate path is utilized instead of a linear path, comb 11 is molded or machined to have the same curvature as arcuate path 5. After module 3 to be tested is moved into the testing station position in socket 6, blades 1 are closed by cam plate 7 which is moved in direction 9.

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Testing Device

This device is a zero insertion force socket for testing electronic modules. Contact blades 1 are arranged in an array which is complementary to the array of pins 2 of module 3. The latter passes unidirectionally through the blade 1 array along section 4 which is molded or machined to form comb 11. This straightens pins 2 of module 3 before it enters the test station. A module can alternatively be made to pass through the blade array along an arcuate path indicated by curved section 5. If an arcuate path is utilized instead of a linear path, comb 11 is molded or machined to have the same curvature as arcuate path 5. After module 3 to be tested is moved into the testing station position in socket 6, blades 1 are closed by cam plate 7 which is moved in direction 9. After electrical testing of module 3 is complete, blades 1 are opened by moving plate 7 in direction 10. Then module 3 is moved out of socket 6 in either a linear or arcuate path identical to the path of entry into such socket.

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