Browse Prior Art Database

Multiturn Core Probe

IP.com Disclosure Number: IPCOM000090621D
Original Publication Date: 1969-Jun-01
Included in the Prior Art Database: 2005-Mar-05
Document File: 2 page(s) / 53K

Publishing Venue

IBM

Related People

Friedman, M: AUTHOR

Abstract

The core probe is for testing ferrite cores. The probe includes flanged stud 1 which is segmented in electrical isolation. A core is placed on stud 1. The probe is moved against two sets of contacts. One set 3 contacts the segmented portion of the stud and with the other set of contacts 4 contacting the segmented portion of flange 5. Thus a pre-determined number of coil turns is defined.

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Multiturn Core Probe

The core probe is for testing ferrite cores. The probe includes flanged stud 1 which is segmented in electrical isolation. A core is placed on stud 1. The probe is moved against two sets of contacts. One set 3 contacts the segmented portion of the stud and with the other set of contacts 4 contacting the segmented portion of flange 5. Thus a pre-determined number of coil turns is defined.

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