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Browse Prior Art Database

Dual Tip Probe

IP.com Disclosure Number: IPCOM000090631D
Original Publication Date: 1969-Jun-01
Included in the Prior Art Database: 2005-Mar-05
Document File: 2 page(s) / 44K

Publishing Venue

IBM

Related People

Young, PM: AUTHOR

Abstract

Probe structure 1 is for contacting spaced terminals, e.g., ball contacts 1, on semiconductor devices 31. Probe 1 includes spaced blades 4 and 5 sufficiently separated by an insulating spacer 6 to contact terminals 2 and 2A. For example, the blade thickness and insulating material are selected to provide 5 mil blades with 3 mil spacer for 5 mil contacts on 8 mil centers. Blades 4 and 5 can be mounted in holder 6, of glass-filled epoxy which can be secured to a mounting 7 such as the Type XY-551 probe assembly, a product of Transistor Automation Corporation.

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Dual Tip Probe

Probe structure 1 is for contacting spaced terminals, e.g., ball contacts 1, on semiconductor devices 31. Probe 1 includes spaced blades 4 and 5 sufficiently separated by an insulating spacer 6 to contact terminals 2 and 2A. For example, the blade thickness and insulating material are selected to provide 5 mil blades with 3 mil spacer for 5 mil contacts on 8 mil centers. Blades 4 and 5 can be mounted in holder 6, of glass-filled epoxy which can be secured to a mounting 7 such as the Type XY-551 probe assembly, a product of Transistor Automation Corporation.

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