Browse Prior Art Database

Multipoint Probe Holder

IP.com Disclosure Number: IPCOM000090735D
Original Publication Date: 1969-Jun-01
Included in the Prior Art Database: 2005-Mar-05
Document File: 2 page(s) / 50K

Publishing Venue

IBM

Related People

Schmidt, H: AUTHOR [+2]

Abstract

Multiprobe assembly 1 is interchangeable on the TAC parallel spring probe holder 2 of the Transistor Automation Corporation. The assembly includes a plurality of alternately arranged contact blades 3 and insulators 4. The thicknesses of blades 3 and insulators 4 are varied to meet terminal, e.g., ball contact, spacing requirements to enable each probe to contact a corresponding terminal. The insulators, between the probe blades can be separate sheaves of insulating material or bonded insulating material. After assembly of the blades and insulators, such assembly is mounted and secured by fasteners 5 to holder 6 of material such as glass-filled epoxy. Holder 6 is provided with elongated angular slots 7 to retain leads 8 in a common plane. The final assembly is then mounted by fasteners 9 to support 10 of TAC holder 2.

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Multipoint Probe Holder

Multiprobe assembly 1 is interchangeable on the TAC parallel spring probe holder 2 of the Transistor Automation Corporation. The assembly includes a plurality of alternately arranged contact blades 3 and insulators 4. The thicknesses of blades 3 and insulators 4 are varied to meet terminal, e.g., ball contact, spacing requirements to enable each probe to contact a corresponding terminal. The insulators, between the probe blades can be separate sheaves of insulating material or bonded insulating material. After assembly of the blades and insulators, such assembly is mounted and secured by fasteners 5 to holder 6 of material such as glass-filled epoxy. Holder 6 is provided with elongated angular slots 7 to retain leads 8 in a common plane. The final assembly is then mounted by fasteners 9 to support 10 of TAC holder 2.

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