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Contact Probe for High Frequency Measurements

IP.com Disclosure Number: IPCOM000090821D
Original Publication Date: 1969-Jul-01
Included in the Prior Art Database: 2005-Mar-05
Document File: 2 page(s) / 44K

Publishing Venue

IBM

Related People

Abbatecola, R: AUTHOR

Abstract

This multiple contact probe is for making accurate high-frequency measurements of unmounted fast transistors and integrated circuits. The probe is fabricated from printed circuit material composed of copper on each side of an epoxy glass center. Three strip lines 1 are etched in the copper on one side. These lines are designed for 50 ohm impedance. Contact probe tips 2 are in a straight line and are very small, of the order of 0.0015 inch wide with a spacing of 0.0025 inch. Contact pads 3, of the same size and spacing as the pads on the transistor to be measured, are plated on the probe tips 2. Plexiglass 7 encloses the printed circuit. Plated through-holes 4 provide connection to ground plane 5, if it is needed. The probe is machined at an angle of 60 degrees to expose probe tips 2.

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Contact Probe for High Frequency Measurements

This multiple contact probe is for making accurate high-frequency measurements of unmounted fast transistors and integrated circuits. The probe is fabricated from printed circuit material composed of copper on each side of an epoxy glass center. Three strip lines 1 are etched in the copper on one side. These lines are designed for 50 ohm impedance. Contact probe tips 2 are in a straight line and are very small, of the order of 0.0015 inch wide with a spacing of
0.0025 inch. Contact pads 3, of the same size and spacing as the pads on the transistor to be measured, are plated on the probe tips 2. Plexiglass 7 encloses the printed circuit. Plated through-holes 4 provide connection to ground plane 5, if it is needed. The probe is machined at an angle of 60 degrees to expose probe tips 2. These are then plated with nickel and gold to provide pads 3. The probe is machined to allow viewing through a microscope when making contact to a transistor, and also for providing probe pads of proper dimension. Copper ground plane 5 is machined to end slightly above he bottom of tips 2 to prevent such plane from contacting the transistor to be measured. To contact a transistor, the probe is moved downwardly so that pads 3 abut the transistor pads.

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