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Test Contactor

IP.com Disclosure Number: IPCOM000091376D
Original Publication Date: 1968-Jan-01
Included in the Prior Art Database: 2005-Mar-05
Document File: 2 page(s) / 60K

Publishing Venue

IBM

Related People

Bresg, V: AUTHOR

Abstract

This slide contactor is for use in conjunction with testing of 3-ball devices 1 supported on a chip handler 2 operating in a rotary mode of indexing. Slide contactor 3 includes three blades 4,5, and 6. mounted 30 degrees apart on dielectric body 7 and positioned tangentially to the arc of the chip motion. As the chip enters the contactor, the cantilever mounting of the contactors permits a deflection of all three blades, during engagement with the chip, a specific amount for correct wipe, force and deflection, with up and down motion of the system eliminated to thus allow more test time.

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Test Contactor

This slide contactor is for use in conjunction with testing of 3-ball devices 1 supported on a chip handler 2 operating in a rotary mode of indexing. Slide contactor 3 includes three blades 4,5, and 6. mounted 30 degrees apart on dielectric body 7 and positioned tangentially to the arc of the chip motion. As the chip enters the contactor, the cantilever mounting of the contactors permits a deflection of all three blades, during engagement with the chip, a specific amount for correct wipe, force and deflection, with up and down motion of the system eliminated to thus allow more test time.

Contamination of the contactors is minimized. This is because the device 1 enters the contactors, the oxide, residue and other contaminants are scraped off the crowns of the device balls 8 with the leading blade surfaces. Therefore improved electrical contact with a chip is obtained.

Longer test times are permitted by the traverse of the ball contacts against the blade edges.

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